Технические наукиFormation Testing. Low Mobility Pressure Transient AnalysisWilson C. Chin, Yanmin Zhou, Yongren Feng, Qiang Yu
Технические наукиFormation Testing. Pressure Transient and Contamination AnalysisWilson C. Chin, Yanmin Zhou, Yongren Feng, Qiang Yu, Lixin Zhao