ПромышленностьApplications and Metrology at Nanometer-Scale 2Abdelkhalak El Hami, Pierre-Richard Dahoo, Philippe Pougnet
Технические наукиApplications and Metrology at Nanometer Scale 1Abdelkhalak El Hami, Pierre-Richard Dahoo, Philippe Pougnet
Технические наукиNanometer-scale Defect Detection Using Polarized LightAbdelkhalak El Hami, Pierre-Richard Dahoo, Philippe Pougnet
